Internally shunted sputtered niobium nitride Josephson junctions with a TaNx barrier for nonlatching logic applications
Description:
This article reports on the growth, fabrication, and device characterization of NbN internally shunted Josephson junctions with a TaNx barrier.
Date:
December 28, 2000
Creator:
Kaul, Anupama; Whiteley, Stephen R.; Van Duzer, Theodore; Yu, Lei; Newman, Nathan & Rowell, John M.
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Partner:
UNT College of Engineering