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Primary view of High Sensitivity Measurement of Implanted as in the Presence of Ge in Ge(x)Si(1-x)/Si Layered Alloys Using Trace Element Accelerator Mass Spectrometry
Datar, Sameer A.; Wu, Liying; Guo, Baonian N.; Nigam, Mohit; Necsoiu, Daniela; Zhai, Y. J. et al.
December 11, 2000
Primary view of Ion Beam Analyses of Carbon Nanotubes
Naab, Fabian U.; Holland, Orin W.; Duggan, Jerome L. & McDaniel, Floyd Del. (Floyd Delbert), 1942-
January 7, 2005
Primary view of Strain fields around high-energy ion tracks in α-quartz
Follstaedt, David M.; Norman, A. K.; Doyle, B. L. & McDaniel, Floyd Del. (Floyd Delbert), 1942-
September 21, 2006
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