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  Access Rights: Public
  Partner: UNT College of Arts and Sciences
 Department: Ion Beam Modification and Analysis Laboratory
 Collection: UNT Scholarly Works
Charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions
This article discusses charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions. digital.library.unt.edu/ark:/67531/metadc139497/
Charge-state dependence of M-shell x-ray production in 67Ho by 2-12-MeV carbon ions
This article discusses charge-state dependence of M-shell x-ray production in 67Ho by 2-12-MeV carbon ions. digital.library.unt.edu/ark:/67531/metadc139496/
Experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉
This article discusses experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉. digital.library.unt.edu/ark:/67531/metadc139489/
Fabrication of silicon-based optical components for an ultraclean accelerator mass spectronomy negative ion source
This article discusses an ultraclean accelerator mass spectronomy negative ion source for semiconductor material mass analysis that was built and is in operation at the University of North Texas' Ion Beam Modification and Analysis Laboratory (IBMAL). digital.library.unt.edu/ark:/67531/metadc146573/
Formation and characterization of ion beam assisted nanosystems in silicon
Article on the formation and characterization of ion beam assisted nanosystems in silicon. digital.library.unt.edu/ark:/67531/metadc139470/
High sensitivity measurement of implanted As in the presence of Ge in Ge(x)Si(1-x)/Si layered alloys using trace element accelerator mass spectrometry
This article discusses high sensitivity measurement of implanted As in the presence of Ge in Ge(x)Si(1-x)/Si layered alloys using trace element accelerator mass spectrometry. digital.library.unt.edu/ark:/67531/metadc146576/
Ion Beam Analyses of Carbon Nanotubes
This article discusses ion beam analyses of carbon nanotubes. digital.library.unt.edu/ark:/67531/metadc146594/
Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry
This article discusses low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry. digital.library.unt.edu/ark:/67531/metadc146577/
Simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils
This article discusses simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils. Knowledge of the incident ion's atomic number (Z₁) dependence of ion-induced electron emission yields can be the basis for a general understanding of ion-atom interaction phenomena and, in particular, for the design of Z₁-sensitive detectors that could be useful, for example, in the separation of isobars in accelerator mass spectrometry. digital.library.unt.edu/ark:/67531/metadc146596/
Strain fields around high-energy ion tracks in α-quartz
This article discusses strain fields around high-energy ion tracks in α-quartz. digital.library.unt.edu/ark:/67531/metadc139473/
Z1 oscillations of the mean charge for isotachic ions in carbon foils
This article discusses Z1 oscillations of the mean charge for isotachic ions in carbon foils. digital.library.unt.edu/ark:/67531/metadc139492/