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High Sensitivity Measurement of Implanted as in the Presence of Ge in Ge(x)Si(1-x)/Si Layered Alloys Using Trace Element Accelerator Mass Spectrometry

Description: This article discusses high sensitivity measurement of implanted As in the presence of Ge in Ge(x)Si(1-x)/Si layered alloys using trace element accelerator mass spectrometry.
Date: December 11, 2000
Creator: Datar, Sameer A.; Wu, Liying; Guo, Baonian N.; Nigam, Mohit; Necsoiu, Daniela; Zhai, Y. J. et al.
Partner: UNT College of Arts and Sciences
open access

Ion Beam Analyses of Carbon Nanotubes

Description: This article discusses ion beam analyses of carbon nanotubes.
Date: January 7, 2005
Creator: Naab, Fabian U.; Holland, Orin W.; Duggan, Jerome L. & McDaniel, Floyd Del. (Floyd Delbert), 1942-
Partner: UNT College of Arts and Sciences
open access

Strain fields around high-energy ion tracks in α-quartz

Description: This article discusses strain fields around high-energy ion tracks in α-quartz.
Date: September 21, 2006
Creator: Follstaedt, David M.; Norman, A. K.; Doyle, B. L. & McDaniel, Floyd Del. (Floyd Delbert), 1942-
Partner: UNT College of Arts and Sciences
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