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  Partner: UNT College of Arts and Sciences
 Department: Ion Beam Modification and Analysis Laboratory
 Language: English
 Collection: UNT Scholarly Works
Charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions
Article discussing research on the charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions. digital.library.unt.edu/ark:/67531/metadc139497/
Charge-state dependence of M-shell x-ray production in 67Ho by 2-12-MeV carbon ions
Article discussing research on the charge-state dependence of M-shell x-ray production in 67Ho by 2-12-MeV carbon ions. digital.library.unt.edu/ark:/67531/metadc139496/
Experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉
This article discusses experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉. digital.library.unt.edu/ark:/67531/metadc139489/
Fabrication of silicon-based optical components for an ultraclean accelerator mass spectronomy negative ion source
Article discussing the fabrication of silicon-based optical components for an ultraclean accelerator mass spectonomy negative ion source. digital.library.unt.edu/ark:/67531/metadc146573/
Formation and characterization of ion beam assisted nanosystems in silicon
Article on the formation and characterization of ion beam assisted nanosystems in silicon. digital.library.unt.edu/ark:/67531/metadc139470/
High sensitivity measurement of implanted As in the presence of Ge in Ge(x)Si(1-x)/Si layered alloys using trace element accelerator mass spectrometry
This article discusses high sensitivity measurement of implanted As in the presence of Ge in Ge(x)Si(1-x)/Si layered alloys using trace element accelerator mass spectrometry. digital.library.unt.edu/ark:/67531/metadc146576/
Ion Beam Analyses of Carbon Nanotubes
This article discusses ion beam analyses of carbon nanotubes. digital.library.unt.edu/ark:/67531/metadc146594/
Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry
This article discusses low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry. digital.library.unt.edu/ark:/67531/metadc146577/
Simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils
Article discussing the simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils. digital.library.unt.edu/ark:/67531/metadc146596/
Strain fields around high-energy ion tracks in α-quartz
This article discusses strain fields around high-energy ion tracks in α-quartz. digital.library.unt.edu/ark:/67531/metadc139473/
Z1 oscillations of the mean charge for isotachic ions in carbon foils
Article discussing Z1 oscillations of the mean charge for isotachic ions in carbon foils. digital.library.unt.edu/ark:/67531/metadc139492/