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  Access Rights: Use restricted to UNT Community
 Department: Department of Engineering Technology
 Collection: UNT Theses and Dissertations
Nodal Resistance Measurement System

Nodal Resistance Measurement System

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Date: May 2005
Creator: Putta, Sunil Kumar
Description: The latest development in the measurement techniques has resulted in fast improvements in the instruments used for measurement of various electrical quantities. A common problem in such instruments is the automation of acquiring, retrieving and controlling the measurements by a computer or a laptop. In this study, nodal resistance measurement (NRM) system is developed to solve the above problem. The purpose of this study is to design and develop a compact electronic board, which measures electrical resistance, and a computer or a laptop controls the board. For the above purpose, surface nodal points are created on the surface of the sample electrically conductive material. The nodal points are connected to the compact electronic board and this board is connected to the computer. The user selects the nodal points, from the computer, between which the NRM system measures the electrical resistance and displays the measured quantity on the computer.
Contributing Partner: UNT Libraries
Surface Plasmon Based Nanophotonic Optical Emitters

Surface Plasmon Based Nanophotonic Optical Emitters

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Date: December 2005
Creator: Vemuri, Padma Rekha
Description: Group- III nitride based semiconductors have emerged as the leading material for short wavelength optoelectronic devices. The InGaN alloy system forms a continuous and direct bandgap semiconductor spanning ultraviolet (UV) to blue/green wavelengths. An ideal and highly efficient light-emitting device can be designed by enhancing the spontaneous emission rate. This thesis deals with the design and fabrication of a visible light-emitting device using GaN/InGaN single quantum well (SQW) system with enhanced spontaneous emission. To increase the emission efficiency, layers of different metals, usually noble metals like silver, gold and aluminum are deposited on GaN/InGaN SQWs using metal evaporator. Surface characterization of metal-coated GaN/InGaN SQW samples was carried out using atomic force microscopy (AFM) and scanning electron microscopy (SEM). Photoluminescence is used as a tool for optical characterization to study the enhancement in the light emitting structures. This thesis also compares characteristics of different metals on GaN/InGaN SQW system thus allowing selection of the most appropriate material for a particular application. It was found out that photons from the light emitter couple more to the surface plasmons if the bandgap of former is close to the surface plasmon resonant energy of particular metal. Absorption of light due to gold reduces the ...
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Synthesis of cubic boron nitride thin films on silicon substrate using electron beam evaporation.

Synthesis of cubic boron nitride thin films on silicon substrate using electron beam evaporation.

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Date: May 2004
Creator: Vemuri, Prasanna
Description: Cubic boron nitride (cBN) synthesis has gained lot of interest during the past decade as it offers outstanding physical and chemical properties like high hardness, high wear resistance, and chemical inertness. Despite of their excellent properties, every application of cBN is hindered by high compressive stresses and poor adhesion. The cost of equipment is also high in almost all the techniques used so far. This thesis deals with the synthesis of cubic phase of boron nitride on Si (100) wafers using electron beam evaporator, a low cost equipment that is capable of depositing films with reduced stresses. Using this process, need of ion beam employed in ion beam assisted processes can be eliminated thus reducing the surface damage and enhancing the film adhesion. Four sets of samples have been deposited by varying substrate temperature and the deposition time. scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS), and Fourier transform infrared spectroscopy (FTIR) techniques have been used to determine the structure and composition of the films deposited. X-ray diffraction (XRD) was performed on one of the samples to determine the thickness of the film deposited for the given deposition rate. Several samples showed dendrites being formed as ...
Contributing Partner: UNT Libraries
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