This working group on 4th Generation Light Source (4GLS) Instrumentation was a follow-up to the opening-discussion on Challenges in Beam Profiling. It was in parallel with the Feedback Systems session. We filled the SSRL Conference Room with about 25 participants. The session opened with an introduction by Lumpkin. The target beam parameter values for a few-angstrom, self-amplified spontaneous emissions (SASE) experiment and for a diffraction-limited soft x-ray storage ring source were addressed. Instrument resolution would of course need to be 2-3 times better than the value measured, if possible. The nominal targeted performance parameters are emittance (1-2{pi} mm mrad), bunch …
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Argonne National Lab., IL (United States)
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This working group on 4th Generation Light Source (4GLS) Instrumentation was a follow-up to the opening-discussion on Challenges in Beam Profiling. It was in parallel with the Feedback Systems session. We filled the SSRL Conference Room with about 25 participants. The session opened with an introduction by Lumpkin. The target beam parameter values for a few-angstrom, self-amplified spontaneous emissions (SASE) experiment and for a diffraction-limited soft x-ray storage ring source were addressed. Instrument resolution would of course need to be 2-3 times better than the value measured, if possible. The nominal targeted performance parameters are emittance (1-2{pi} mm mrad), bunch length (100 fs), peak-current (l-5 kA), beam size (10 {micro}m), beam divergence (1 {micro}rad), energy spread (2 x 10{sup {minus}4}), and beam energy (10's of GeV). These are mostly the SASE values, and the possible parameters for a diffraction-limited soft x-ray source would be relaxed somewhat. Beam stability and alignment specifications in the sub-micron domain for either device are anticipated.
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