Charge Collection Studies on Integrated Circuit Test Structures using Heavy-Ion Microbeams and MEDICI Simulation Calculations

Citation

Guo, Baonian. Charge Collection Studies on Integrated Circuit Test Structures using Heavy-Ion Microbeams and MEDICI Simulation Calculations. Denton, Texas. UNT Digital Library. http://digital.library.unt.edu/ark:/67531/metadc2469/. Accessed August 30, 2014.

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